Nano Measurement in Production Subarea

Associate Professor MIZUTANI Yasuhiro
Assistant Professor UENOHARA Tsutomu

We integrate nano measurement and fabrication in order to establish the highly developped nano production system. Our research are based on the laser applied measurement and fabrication techniques. One of the typical research topics is developping nano-CMM system for nano in-process measurement. Optical radiation force is applied for controlling the sensitive non-contact probe in the integrated nano maching system. This probe is expected to realize better than 10nm resolution during 3-D coordinate measureing.

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